Focused ion beam

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Notion

Domain

Science and technology

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What Wikipedia says

Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM).

Excerpt from the Wikipedia article “Focused ion beam”, under the CC BY-SA 4.0 license. Read the article on Wikipedia

Image: english User:Cm the p, CC BY-SA 3.0, via Wikimedia Commons.